Anglais [eBook] Reliability Wearout Mechanisms in Advanced CMOS Technologies

Résumé

This invaluable resource tells the complete story of failure mechanisms-from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.

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  • EAN

    9780470455258

  • Disponibilité

    Disponible

  • Nombre de pages

    864 Pages

  • Action copier/coller

    Non

  • Action imprimer

    Dans le cadre de la copie privée

  • Nb pages imprimables

    864

  • Partage

    Dans le cadre de la copie privée

  • Nb Partage

    6 appareils

  • Poids

    8 366 Ko

  • Distributeur

    Numilog

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